Measuring leaf areas with a structured-light 3D scanner = 3차원 구조광 스캐너를 이용한 식물의 잎 면적 측정 방법

Abstract

We have developed a non-destructive, touch-free method for estimating leaf areas with a structuredlight three-dimensional (3D) scanner. When the surfaces of soybean leaves were analyzed with both the 3D scanner and a leaf area meter, the results were linearly related (R2=0.90). The strong correlation (R2=0.98) was calculated between shoot fresh weights and leaf areas when the scanner was employed during growth stages V1 to V4. We also found that leaf areas measured by the scanner could be used to detect changes in growth responses to abiotic stress. Whereas under control conditions the areas increased over time, salt and drought treatments were associated with reductions in those values after 14 d and 12 d, respectively. Based on our findings, we propose that a structured-light 3D scanner can be used to obtain reliable estimates of leaf area and plant biomass.