Single photomask lithography for shape modulation of micropatterns

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dc.contributor.authorS H Lee-
dc.contributor.authorS E Seo-
dc.contributor.authorKyung Ho Kim-
dc.contributor.authorJiyeon Lee-
dc.contributor.authorChul Soon Park-
dc.contributor.authorB H Jun-
dc.contributor.authorSeon Joo Park-
dc.contributor.authorOh Seok Kwon-
dc.date.accessioned2020-09-24T03:06:55Z-
dc.date.available2020-09-24T03:06:55Z-
dc.date.issued2020-
dc.identifier.issn1226-086X-
dc.identifier.urihttps://oak.kribb.re.kr/handle/201005/22633-
dc.description.abstractPhotolithography has been used to fabricate various micropatterns; however, recent efforts have focused on the scaling-down process to reduce the feature sizes of the desired patterns and not redefining existing micropatterns. Here, we describe single-mask photolithography method for the shape modulation of designed patterns with a single-mask that utilizes the intrinsic properties of a monolithic photoresist. Our novel approach can achieve various micropatterns with different open areas by adjusting a few fabrication parameters. To create the modulated micropatterns, the material and physical parameters (e.g., soft-bake temperature and exposure dose) were altered and successfully produced modulated shapes. This approach can produce well-controlled micropatterns with desired shapes over a large area with high throughput. Furthermore, our new approach enables access to numerous varieties of micropatterns and can be expandable to two dimensional (2D) and thre dimensional (3D) multiscale architectures.-
dc.publisherElsevier-
dc.titleSingle photomask lithography for shape modulation of micropatterns-
dc.title.alternativeSingle photomask lithography for shape modulation of micropatterns-
dc.typeArticle-
dc.citation.titleJournal of Industrial and Engineering Chemistry-
dc.citation.number0-
dc.citation.endPage201-
dc.citation.startPage196-
dc.citation.volume84-
dc.contributor.affiliatedAuthorKyung Ho Kim-
dc.contributor.affiliatedAuthorJiyeon Lee-
dc.contributor.affiliatedAuthorChul Soon Park-
dc.contributor.affiliatedAuthorSeon Joo Park-
dc.contributor.affiliatedAuthorOh Seok Kwon-
dc.contributor.alternativeName이상훈-
dc.contributor.alternativeName서성은-
dc.contributor.alternativeName김경호-
dc.contributor.alternativeName이지연-
dc.contributor.alternativeName박철순-
dc.contributor.alternativeName전봉현-
dc.contributor.alternativeName박선주-
dc.contributor.alternativeName권오석-
dc.identifier.bibliographicCitationJournal of Industrial and Engineering Chemistry, vol. 84, pp. 196-201-
dc.identifier.doi10.1016/j.jiec.2019.12.034-
dc.subject.keywordExposure dose-
dc.subject.keywordShape modulation-
dc.subject.keywordSingle photomask-
dc.subject.keywordSingle photomask lithography-
dc.subject.keywordSoft-bake temperature-
dc.subject.localExposure dose-
dc.subject.localShape modulation-
dc.subject.localSingle photomask-
dc.subject.localSingle photomask lithography-
dc.subject.localSoft-bake temperature-
dc.description.journalClassY-
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Division of Research on National Challenges > Infectious Disease Research Center > 1. Journal Articles
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