Degradation properties of n-alkane assimilating Pseudomonas putida 3SK carrying CAM::TOL plasmid and NAH plasmid

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Title
Degradation properties of n-alkane assimilating Pseudomonas putida 3SK carrying CAM::TOL plasmid and NAH plasmid
Author(s)
Hyo Kon Chun; K Y Cho; Yung Hee Kho
Bibliographic Citation
Journal of Microbiology and Biotechnology, vol. 4, no. 4, pp. 270-273
Publication Year
1994
Keyword
Pseudomonas putida 3SKmultiplasmid straindegradationfloc
ISSN
1017-7825
Publisher
Korea Soc-Assoc-Inst
Type
Article
Appears in Collections:
Division of Bio Technology Innovation > SME Support Center > 1. Journal Articles
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